By Tibor Grasser
This e-book offers readers with various instruments to handle the demanding situations posed via scorching provider degradation, considered one of today’s most complex reliability concerns in semiconductor devices. assurance contains an evidence of provider shipping inside of units and book-keeping of ways they gather power (“become hot”), interplay of an ensemble of chillier and warmer providers with illness precursors, which finally ends up in the construction of a disorder, and an outline of ways those defects have interaction with the equipment, degrading its performance.
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Hot Carrier Degradation in Semiconductor Devices by Tibor Grasser